GXM-XJL302BD, 50X – 800X, Materials/Semiconductor Routine; Research Microscope

Description

A large specimen capacity, top quality materials microscope suitable for viewing silicon wafers, assemblies and standard metallurgical reflective specimens. It is equipped with infinity optics with darkfield / brightfield incident (reflected) illumination. It also has a trinocular head ready for the attachment of a digital camera. This microscope includes a full set of high quality infinity BD plan achromatic materials objectives on a rotatable objective turret.

Specimens can placed on the very large mechanical stage (can take 8in wafers) with controls for XY stage movement including a rapid traverse override control, perfect for scanning over large areas. The focussing tension can be adjusted and a focus lock protects the objectives from damage.

Illumination is provided from a powerful, integral reflectedlight illuminator with a 50W halogen lamp with adjustable intensity, field and aperture diaphragms, polariser and set of Y, G, B and diffusion filters This microscope is built on GX Microscopes largest and highly robust XJL upright series industrial microscope frame which provides high stability and a durable platform suitable for the most demanding of applications. Options include a range of camera adapters, digital cameras, image analysis software, additional objectives and eyepieces.

Additional product information