Leica EM TXP Target Surfacing System

Description

Introducing the Leica EM TXP target preparation instrument.

Designed for preparing samples prior to examination by SEM, TEM and light microscopy techniques, the EM TXP mills, saws, grinds and polishes the samples.

The Leica EM TXP Microscope includes an integrated stereomicroscope, aiding identification and preparation of barely visible targets.

Applications:

• SEM sample preparation
• TEM sample preparation
• Light microscopy sample preparation

Shipping:

Shipping is by courier and takes typically 17-21 days but this can alter so please phone us on +44 (0)1284 789697 or email us for current delivery times.

Resources:

• Download the brochure here
• Request a quotation by emailing sales@gtvision.co.uk
• Request a demonstration of the microscope by emailing sales@gtvision.co.uk
• View GT Vision’s full range of materials microscopes.

Why buy from GT Vision?

• Because we supply microscopes from a wide variety of brands and manufacturers, we can offer expert advice on which microscope model is best suited for your application and budget without bias towards a particular brand.
• We provide tailor-built systems to match your specific requirements and budget, often consisting of parts from a number of different brands.
• For a full system solution, we also supply microscope cameras and software (again from a wide choice of brands).
• We can retro-fit cameras and illumination systems, including modern LED fluorescence illuminators, to most models and ages of existing microscopes. We also have in-house engineering capabilities for particularly unique requirements.